Reliability of power electronic converter systems by Henry Shu-hung Chung, Frede Blaabjerg, Huai Wang, Michael

By Henry Shu-hung Chung, Frede Blaabjerg, Huai Wang, Michael Pecht

The most goals of energy digital converter platforms (PECs) are to manage, convert, and situation electrical energy circulate, from one shape to a different, by utilizing solid-state electronics. This publication outlines R&D into the clinical modelling, experimentation and remedial measures for advancing the reliability, availability, approach robustness, and maintainability of PECs at varied degrees of complexity.

Drawing at the adventure of a world staff of specialists, this publication covers an advent to reliability engineering and the reliability of PECs; lifetime diagnosis; and robustness validation. It additionally covers purposes together with low- and high-power motor drives, wind turbine structures, photovoltaic structures, uninterruptible energy offer platforms, strength harvesting, strength offers for pcs, high-power converters, and car applications.

Reliability of energy digital Converter Systems might be of specific curiosity to execs in energy electronics, and the appliance sectors, and training engineers focusing on the improvement and alertness to strength digital converters and structures

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30, no. 5, pp. 2456–2464, May 2015. IEEE, IEEE standard framework for the reliability prediction of hardware, IEEE Std. 1413, New York, 2009. W. B. Nelson, Accelerated testing – statistical models, test plans, and data analysis, Hoboken: John Wiley & Sons, 2004, ISBN: 978-0471697367. General Motors Corporation Handbook GMW8758, Calibrated accelerated life testing, Detroit, MI, 2004. K. Bhote and A. Bhote, World class reliability: using multiple environment overstress tests to make it happen, West Sussex, England: AMACOM, 2004, ISBN: 978-0814407929.

Hence, it is an appealing possibility to modify the modulation and control the power converter using as a feedback the junction temperature of the most stressed device. 14 gives the general block diagram for active thermal control of the power semiconductors once the junction temperature is measured or estimated. More details on active thermal control will be discussed in Chapter 8. 3. Fault-tolerant control Working outside the safe operating area leads to damage of power electronic components.

It is therefore useful to implement a generalized probabilistic approach to determine thresholds for anomaly detection [48]. Mahalanobis distance (MD) is a distance measure that is used in applications such as anomaly detection, pattern recognition, and process control [49]. In electronics, MD has been used for detecting anomalies in notebook computers [48] and multilayer ceramic capacitors [50]. Kumar et al. [48] developed a probabilistic technique for determining detection thresholds using MD, followed by a power transformation of the MD values, which are always positive, so that they follow the normal distribution.

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